ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,067, issued on July 14, was assigned to DISCO Corp. (Tokyo). "Wafer processing method and wafer processing system" was invented by Yuki Ino... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,068, issued on July 14, was assigned to Tokyo Electron Ltd. (Tokyo). "Substrate processing method and substrate processing apparatus" was i... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,069, issued on July 14, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Manufacturing method of the semicon... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,070, issued on July 14, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Integrated die ejector for die attach ejector device... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,071, issued on July 14, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Semiconductor wafer processing ... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,072, issued on July 14, was assigned to Kulicke and Soffa Hi-Tech Co. Ltd. (New Tapei City, Taiwan). "Working station systems for dispensin... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,073, issued on July 14, was assigned to SEMES Co. LTD. (Chungcheongnam-Do, South Korea). "Auto teaching apparatus including test substrate ... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,074, issued on July 14, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Apparatus, systems, and methods of measuring edge ri... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,075, issued on July 14, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Method for mapping wafers in a wafe... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,076, issued on July 14, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Pressure puck diagnostic wafer" was invented by Kost... Read More